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Senior Project Manager, Last organization NXP Semiconductors
The widespread use of edge devices in the Industrial Internet of Things (IIoT) has led to applications in smart manufacturing, intelligent transportation, energy, water, and logistics. While these devices enable real-time decision-making, they face security risks from abnormal IIoT nodes, hindering IIoT development. Edge devices collect time-series data to monitor the behavior of IIoT nodes, which can be used to detect anomalies. However, traditional anomaly detection methods struggle with dynamic complexities and lack labeled data for training. Current unsupervised methods do not fully capture spatial-temporal correlations in multivariate time-series data, leading to limited effectiveness. This paper addresses these challenges using a Federated learning-based AM CNN LSTM unsupervised technique for accurate, real-time anomaly detection in IIoT.
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